发明名称 Lithographic apparatus and device manufacturing method
摘要 A lithographic apparatus includes a support structure configured to hold a patterning device, the patterning device configured to pattern a beam of radiation according to a desired pattern, a substrate table configured to hold a substrate and a projection system configured to project the beam as patterned onto a target portion of the substrate. The lithographic apparatus further includes a polarization modifier disposed in a path of the beam. The polarization modifier comprises a material having a linear polarization.
申请公布号 US8339574(B2) 申请公布日期 2012.12.25
申请号 US20080192676 申请日期 2008.08.15
申请人 TOTZECK MICHAEL;GEH BERND PETER;MILLER SKIP;ASML NETHERLANDS B.V.;CARL ZEISS SMT GMBH 发明人 TOTZECK MICHAEL;GEH BERND PETER;MILLER SKIP
分类号 G02B3/10;G02B17/00;G03B27/42;G03B27/52;G03B27/54;G03B27/72 主分类号 G02B3/10
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