发明名称 SEMICONDUCTOR DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide a semiconductor device having a long lifespan and high reliability by causing the semiconductor device to have a configuration of suppressing thermal deterioration of a semiconductor element. <P>SOLUTION: A semiconductor element 1 is mounted on a support substrate 2. A thermal conducting part 3 is formed on at least a surface 2f of the support substrate 2. The semiconductor element 1 is mounted on the thermal conducting part 3 via a high-heat conducting adhesive agent 6. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012253073(A) 申请公布日期 2012.12.20
申请号 JP20110122341 申请日期 2011.05.31
申请人 OLYMPUS CORP 发明人 SHIBAYAMA YU
分类号 H01L33/64;F21V19/00;F21V29/00;F21Y101/02;H01L33/62 主分类号 H01L33/64
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