| 摘要 |
One or more techniques and/or systems are disclosed for generating a linearized pressure sensor pattern for a pressure sensor. Force may be applied to a pressure sensor sample, comprising the pressure sensor without conductors. A patch, comprising an area of contact between a top and bottom surface of the sensor sample, can be measured, which corresponds to the applied force. Patch measurements can be made for respective applied force intervals, resulting in one or more indications of applied force, respectively corresponding to an indication of a patch measurement. The linearized pressure sensor pattern can be generated using the one or more force indications and corresponding patch measurement indications.
|
