发明名称 |
METHOD OF FORMING RESIST PATTERN |
摘要 |
<p>PURPOSE: A method for forming a resist pattern is provided to miniaturize a pattern dimension by pulling a sidewall of a pattern part of a resist film toward a gap between patterns with thermally shrunk coating film. CONSTITUTION: A resist film is formed on a supporter using a resist composition. The resist film is exposed. A resist pattern is formed by patterning the resist film with negative development which uses a developer containing an organic solvent. A coating film is formed by coating a coating film material on a resist pattern. A gap between resist patterns becomes narrower with thermal contraction of the coating film by performing a thermal process at temperatures lower than a softening point of the resist pattern. The coating film is removed.</p> |
申请公布号 |
KR20120137261(A) |
申请公布日期 |
2012.12.20 |
申请号 |
KR20120060816 |
申请日期 |
2012.06.07 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
NAKAMURA TSUYOSHI;ISHIKAWA KIYOSHI |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|