发明名称 METHOD OF FORMING RESIST PATTERN
摘要 <p>PURPOSE: A method for forming a resist pattern is provided to miniaturize a pattern dimension by pulling a sidewall of a pattern part of a resist film toward a gap between patterns with thermally shrunk coating film. CONSTITUTION: A resist film is formed on a supporter using a resist composition. The resist film is exposed. A resist pattern is formed by patterning the resist film with negative development which uses a developer containing an organic solvent. A coating film is formed by coating a coating film material on a resist pattern. A gap between resist patterns becomes narrower with thermal contraction of the coating film by performing a thermal process at temperatures lower than a softening point of the resist pattern. The coating film is removed.</p>
申请公布号 KR20120137261(A) 申请公布日期 2012.12.20
申请号 KR20120060816 申请日期 2012.06.07
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 NAKAMURA TSUYOSHI;ISHIKAWA KIYOSHI
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
主权项
地址