发明名称 |
Adjusting Capacitance of Capacitors without Affecting Die Area |
摘要 |
According to one exemplary embodiment, a method for adjusting geometry of a capacitor includes fabricating a first composite capacitor residing in a first standard cell with a first set of process parameters. The method further includes using a second standard cell having substantially same dimensions as the first standard cell. The method further includes using a capacitance value from the first composite capacitor to adjust a geometry of a second composite capacitor residing in the second standard cell, wherein the second composite capacitor is fabricated with a second set of process parameters. The geometry of the second composite capacitor can be adjusted to cause the second composite capacitor to have a capacitance value substantially equal to the capacitance value from the first composite capacitor.
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申请公布号 |
US2012315711(A1) |
申请公布日期 |
2012.12.13 |
申请号 |
US201213592765 |
申请日期 |
2012.08.23 |
申请人 |
HUANG PETER;CHEN MING-CHUN;BROADCOM CORPORATION |
发明人 |
HUANG PETER;CHEN MING-CHUN |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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