发明名称 Adjusting Capacitance of Capacitors without Affecting Die Area
摘要 According to one exemplary embodiment, a method for adjusting geometry of a capacitor includes fabricating a first composite capacitor residing in a first standard cell with a first set of process parameters. The method further includes using a second standard cell having substantially same dimensions as the first standard cell. The method further includes using a capacitance value from the first composite capacitor to adjust a geometry of a second composite capacitor residing in the second standard cell, wherein the second composite capacitor is fabricated with a second set of process parameters. The geometry of the second composite capacitor can be adjusted to cause the second composite capacitor to have a capacitance value substantially equal to the capacitance value from the first composite capacitor.
申请公布号 US2012315711(A1) 申请公布日期 2012.12.13
申请号 US201213592765 申请日期 2012.08.23
申请人 HUANG PETER;CHEN MING-CHUN;BROADCOM CORPORATION 发明人 HUANG PETER;CHEN MING-CHUN
分类号 H01L21/66 主分类号 H01L21/66
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