发明名称 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a microfabricated semiconductor device having gate electrodes which are mutually separated on the opposing side faces of a trench. <P>SOLUTION: In steps of forming a trench 4 and a gate insulating film 6, the trench 4 and gate insulating film 6 are formed by adjusting, when a part of the trench 4 that contacts a second conductivity type layer 3 is assumed to be an intermediate part, a spacing of the gate insulating film 6 which is formed on the opposing side faces of the trench 4 so that a spacing W1 at a part that is formed at the opening of the trench 4 is narrower than a spacing W2 at a part that is formed at the intermediate part of the trench 4. In a step of forming a conductive film 7a, the conductive film 7a is formed while an air gap 14 surrounded by the conductive film 7a is formed in the trench 4. Then, in a step of forming a gate electrode 7, the gate electrode 7 is formed by anisotropically etching the conductive film 7a and removing the conductive film 7a formed on the bottom of the trench 4 through the air gap 14. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012248604(A) 申请公布日期 2012.12.13
申请号 JP20110117787 申请日期 2011.05.26
申请人 DENSO CORP 发明人 TAKEYA HIDEKAZU
分类号 H01L29/78;H01L21/28;H01L21/336;H01L29/41;H01L29/423;H01L29/49 主分类号 H01L29/78
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