发明名称 Dual Probing Tip System
摘要 A dual probing tip system uses a slot and rail system to provide variable spacing and lateral and axial compliance of the probing tips mounted on first and second support members. A movable base member is secured on a frame with the base member having a rack of linear teeth and a pair of rails angled toward the front. First and second intermediate carriers each have a slot that engages one of the angled rails. Each of the carriers has stanchions that receive a thumb wheel pinion gear mounted on a shaft. The pinion gear mates with the teeth on the base member for movement of the carriers. Each support member has an axial slot that mated with an axial slot on each one of the carriers. Each support member has a compression spring which allows axial compliance of the support members.
申请公布号 US2012313658(A1) 申请公布日期 2012.12.13
申请号 US201213487069 申请日期 2012.06.01
申请人 SPINAR JAMES E.;LYNN RICHARD R.;TEKTRONIX, INC. 发明人 SPINAR JAMES E.;LYNN RICHARD R.
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人
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