发明名称 ABNORMAL SOUND DIAGNOSTIC EQUIPMENT
摘要 PURPOSE: An abnormal sound diagnosis device is provided to uniformly diagnose abnormal sound components having lasting time and various bandwidths shown in a frequency analysis result at high precision. CONSTITUTION: An abnormal sound diagnosis device comprises a waveform obtaining unit(2), a time frequency analyzing unit(4), a region extracting unit(13), and a judging unit(17). The waveform obtaining unit obtains the waveform data of sounds or vibration generated by an inspection object. The time frequency analyzing unit obtains time frequency distribution by time-frequency analyzing the waveform data. The region extracting unit generates a plurality of regions regulated by a coordinate value of a time axis and a frequency axis of the time frequency distribution and extracts a region including variation components different from a normal state of the time frequency distribution. The judging unit judges the abnormality based on the time frequency distribution being included in the extraction region. [Reference numerals] (1) Measurement signal; (10) Region candidate; (11) Evaluating unit; (12) Condensation degree; (13) Region extracting unit; (14) Extraction region; (15) Abnormality calculating unit; (16) Abnormality; (17) Judging unit; (18) Judgment result; (2) Waveform obtaining unit; (3) Waveform data; (4) Time frequency analyzing unit; (5) Time frequency distribution; (6) Time frequency distribution memory unit in a normal case; (7) Time frequency distribution memory unit in diagnosing; (8) Prior knowledge memory unit; (9) Region candidate generating unit; (AA) Study; (BB) Diagnosis
申请公布号 KR20120135035(A) 申请公布日期 2012.12.12
申请号 KR20120049142 申请日期 2012.05.09
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 ABE YOSHIHARU
分类号 G01H17/00;G01M7/02 主分类号 G01H17/00
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