发明名称 |
EXPOSURE APPARATUS, EXPOSURE METHOD, MANUFACTURING METHOD FOR DISPLAY PANEL SUBSTRATE AND INSPECTION METHOD FOR EXPOSURE APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To reduce distortion of light beam output from a light beam irradiation device and improve drawing accuracy. <P>SOLUTION: An exposure apparatus comprises: a first image acquisition device (CCD camera 51) that is provided at a chuck 10; and a reticle 2 that is provided with a testing pattern and is arranged between a head part of a light beam irradiation device 20 and the first image acquisition device. The exposure apparatus executes steps of: supplying drawing data for testing to a drive circuit of the light beam irradiation device 20; using the first image acquisition device to acquire an image of the testing pattern 2a of the reticle 2 and an image 2c of light beam incident from the light beam irradiation device 20; detecting displacement of the light beam on the basis of the image of the testing pattern 2a of the reticle 2 and the image 2c of the light beam that are acquired by the first image acquisition device, and detecting distortion of the light beam; correcting a coordinate of drawing data for exposure on the basis of a result of detecting the distortion of the light beam; and supplying the drawing data for exposure to the drive circuit of the light beam irradiation device 20. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012242630(A) |
申请公布日期 |
2012.12.10 |
申请号 |
JP20110113048 |
申请日期 |
2011.05.20 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
HAYASHI TOMOAKI;YOSHIDA MINORU;HONDA HIDEYUKI |
分类号 |
G03F7/20;G02F1/13;G03F9/00;H01L21/027 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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