发明名称 |
POSITIVE RESIST COMPOSITION AND METHOD FOR FORMING RESIST PATTERN |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a positive resist composition capable of reducing defects and to provide a method for forming a resist pattern using the resist composition. <P>SOLUTION: The positive resist composition includes: a base component (A) the solubility of which with an alkali developing solution increases by an action of an acid; an acid generator component (B) generating an acid by exposure; a fluorine-containing compound component (F); and a photosensitizer (G). The fluorine-containing compound component (F) preferably includes a resin component (F1) having a structural unit (f1) containing a fluorine atom, the structural unit derived from an acrylate in which an atom except for a hydrogen atom or a substituent may be bonded to a carbon atom at an α-position; and the structural unit (f1) is preferably a structural unit expressed by formula (f1-1). <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012242800(A) |
申请公布日期 |
2012.12.10 |
申请号 |
JP20110116132 |
申请日期 |
2011.05.24 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
IWASAWA YUTA;ENDO KOTARO;KUROSAWA TSUYOSHI |
分类号 |
G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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