发明名称 SEMICONDUCTOR DEVICE, SEMICONDUCTOR PACKAGE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a highly reliable semiconductor device. <P>SOLUTION: A semiconductor device comprises: an N-type substrate 10; a P-type well 40 provided on one surface side of the N-type substrate 10; a P-type high concentration impurity region 42 provided in the P-type well 40; a MOS transistor 20 including an N-type source-drain region provided in the P-type well 40; and a MOS transistor 30 provided on the one surface side of the N-type substrate 10 and including a source-drain region electrically connected with the P-type high concentration impurity region 42 on one side and grounded on another side. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012243930(A) 申请公布日期 2012.12.10
申请号 JP20110112151 申请日期 2011.05.19
申请人 RENESAS ELECTRONICS CORP 发明人 KATO HIROO
分类号 H01L27/06;H01L21/822;H01L21/8234;H01L27/04;H01L27/088;H01L29/78 主分类号 H01L27/06
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