发明名称 |
METAL ETCHING METHOD, METAL ETCHING CONTROL METHOD AND CONTROL DEVICE THEREOF |
摘要 |
Disclosed is a metal etching method, a metal etching control method and a control device thereof. The metal etching control method is employed in a metal wet etching machine and comprises steps below: performing etching to a metal film and acquiring an etching end time of the metal film; multiplying the etching end time with a constant ratio to acquire the over etching time of the metal film; and performing etching to the metal film with the over etching time to complete the etching to the metal film. The present invention can precisely judge a total real etching time needed for each of a batch of metal films as performing metal etching to the metal films to reduce the issue of unstable etching qualities as the metal film thicknesses are not regular.
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申请公布号 |
US2012305186(A1) |
申请公布日期 |
2012.12.06 |
申请号 |
US201213589174 |
申请日期 |
2012.08.20 |
申请人 |
WANG CHIN-WEN;HE CHENGMING;SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO. LTD. |
发明人 |
WANG CHIN-WEN;HE CHENGMING |
分类号 |
C23F1/08 |
主分类号 |
C23F1/08 |
代理机构 |
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代理人 |
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