| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve such problems that, when an inspection that cannot be performed on all disks is performed in an optical disk inspection step, a sampling inspection is performed on manufactured disks by an off-line inspection device to inspect recording abnormality and the like, however, such inspection requires much time and causes to delay a feedback to a manufacturing step. <P>SOLUTION: The optical disk manufacturing apparatus includes: a molding step for molding a polycarbonate substrate; a film forming step for forming a metal film; a light transmission film forming step for forming a light transmission layer thereon; a moisture-proof film forming step for forming a moisture-proof film that prevents the substrate from absorbing moisture in atmosphere; an external appearance inspection step executed using a CCD camera; and an electric characteristic inspection step for inspecting electric characteristics. The electric characteristic inspection step includes a record reproduction function, and comprises: performing a sampling inspection at prescribed intervals; determining the measured data; statistically processing data transition; predicting deterioration in signal characteristics; detecting common defects; and feeding them back to the manufacturing step. <P>COPYRIGHT: (C)2013,JPO&INPIT |
