MEASURING DEVICE ELECTRONIC SYSTEM FOR A MEASURING DEVICE AND METHOD FOR CHECKING THE MEASURING DEVICE

摘要

The measuring device electronic system comprises a processor and two clock generators (TG1, TG2). The clock generator (TG1) is used to generate a clock cycle signal (clk0) with a nominally constant clock frequency, fclk0_SOLL, said clock cycle signal clocking the processor, and to generate a reference clock signal (clk1) which is dependent on the clock cycle signal (clk0) and which has a nominally constant clock frequency, fclk1_SOLL, that is smaller than the clock frequency, fclk0_SOLL, of the clock cycle signal by a specified multiple. The clock generator (TG1) is used to generate a second reference clock signal (clk2) which is independent of the clock cycle signal (clk0) and which has a nominally constant clock frequency, fclk2_SOLL, that is smaller than the clock frequency, fclk0_SOLL, of the clock cycle signal by a specified multiple. Using the two independent reference clock signals (clk1, clk2), a frequency difference, ?f, can be ascertained, if present, during the operation of the measuring device electronic system or the measuring device produced with said electronic system, wherein the frequency difference represents a difference between the current clock frequency of the first reference clock signal and the current clock frequency of the second reference clock signal and thus represents a measurement of a deviation of a current clock frequency, fclk0_IST, from the nominally specified clock frequency, fclk0_SOLL, of the clock cycle signal.