发明名称 CHARGED PARTICLE BEAM IRRADIATION APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To downscale a charged particle beam irradiation apparatus and prevent ingress of radiation from electromagnets from into an irradiation chamber. <P>SOLUTION: The charged particle beam irradiation apparatus 10 includes: a transport line 31 for transporting the charged particle beam; an irradiation section for irradiating the charged particle beam to an irradiation subject; and a rotating gantry 12 for supporting the transport line 31 and the irradiation section and housing a cylinder 13 rotatable around a rotating axis line P; and the slant portion 33 of the transport line 31 passes through the inside of the cylinder 13. Herewith, the amount of overhang of the transport line 31 in the radius direction is reduced, and moreover shielding members 61 and 62 are prepared to shield the radiations from the electromagnets 41, 34 and 32. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012235893(A) 申请公布日期 2012.12.06
申请号 JP20110106562 申请日期 2011.05.11
申请人 SUMITOMO HEAVY IND LTD 发明人 SASAI KENZO
分类号 A61N5/10;G21K1/02;G21K5/04 主分类号 A61N5/10
代理机构 代理人
主权项
地址