发明名称 ON-THE-FLY DEVICE CHARACTERIZATION FROM LAYOUTS OF CIRCUITS
摘要 PURPOSE: A real-time device characterization method in a layout of a circuit is provided to select an optimal layout method by evaluating alternative layout methods. CONSTITUTION: A layout module(20) includes a computing unit(28). The computing unit extracts layout parameters of an IC(integrated circuit) device existing in the circuit during a layout step of a circuit. The computing unit calculates circuit parameters of the IC device by using the layout parameters. An UI(user interface)(26) displays the circuit parameters of the device in response to the selection of a user for the device. [Reference numerals] (20) LDE-recognition layout module; (22) Schematic editor; (24) Layout editor; (26) Application user interface; (28) Computing unit; (29) Trend analysis unit
申请公布号 KR20120132273(A) 申请公布日期 2012.12.05
申请号 KR20110081277 申请日期 2011.08.16
申请人 发明人
分类号 G06F17/50;G06F3/14 主分类号 G06F17/50
代理机构 代理人
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