发明名称 DEFECT INSPECTION DEVICE
摘要 <p>There is provided a defect inspecting apparatus capable of inspecting defects on a load face and in a thread bottom face inspection zone of a pipe or tube in which the load face is inclined inwardly in the pipe or tube axis direction, and also capable of inspecting a defect on the outer peripheral surface of a lip part. The defect inspecting apparatus includes a first light source 2, a first image capture device 3 that receives the reflection light emitted from the first light source and reflected by the outer peripheral surface of a lip part 102 to grab the image of the outer peripheral surface of the lip part, a second light source 7, a second image capture device 8 that receives the reflection light emitted from the second light source and reflected by a load face 103 to grab the image of the load face, a third light source 9, a third image capture device 10 that receives the reflection light emitted from the third light source and reflected by a thread bottom face inspection zone 106 to grab the image of the thread bottom face inspection zone, and an inspection device for inspecting defects on the outer peripheral surface of the lip part, on the load face, and in the thread bottom face inspection zone by processing the captured images grabbed by the first to third image capture devices.</p>
申请公布号 EP2530457(A1) 申请公布日期 2012.12.05
申请号 EP20110737083 申请日期 2011.01.27
申请人 SUMITOMO METAL INDUSTRIES, LTD. 发明人 ANAYAMA KAZUNORI;SUZUMA TOSHIYUKI;NAKAO YOSHIYUKI;IKEDA MASAMI;SAKAI KENTA
分类号 G01N21/952 主分类号 G01N21/952
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