发明名称 Method of producing a semiconductor device with an aluminum or aluminum alloy electrode
摘要 A method of producing a semiconductor device that has a silicon substrate including a first major surface and a second major surface thereof, a front surface device structure being formed in a region of the first major surface, the method has a step of forming a rear electrode in a region of the second major surface, which includes evaporating or sputtering aluminum-silicon onto the second major surface to form an aluminum silicon film as a first layer of the rear electrode, the aluminum silicon film having a silicon concentration of at least 2 percent by weight when the thickness thereof is less than 0.3 μm.
申请公布号 US8324044(B2) 申请公布日期 2012.12.04
申请号 US20100971173 申请日期 2010.12.17
申请人 KAZAMA KENICHI;NAKAJIMA TSUNEHIRO;SASAKI KOJI;SHIMIZU AKIO;HAYASHI TAKASHI;WAKIMOTO HIROKI;FUJI ELECTRIC CO., LTD. 发明人 KAZAMA KENICHI;NAKAJIMA TSUNEHIRO;SASAKI KOJI;SHIMIZU AKIO;HAYASHI TAKASHI;WAKIMOTO HIROKI
分类号 H01L21/8249 主分类号 H01L21/8249
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