发明名称 Fuse of a semiconductor device
摘要 A method for forming a fuse of a semiconductor device includes performing an ion-implanting process at sides of a fuse blowing region of a metal fuse, thereby increasing the concentration of impurity ions of a thermal transmission path region. In a subsequent laser blowing process, as a result of the increased resistance of metal fuse the electric and thermal conductivity is reduced, thereby increasing the thermal condensation efficiency of the fuse blowing region and improving the efficiency of the laser blowing process.
申请公布号 US8324664(B2) 申请公布日期 2012.12.04
申请号 US201113205275 申请日期 2011.08.08
申请人 KO MIN GU;HYNIX SEMICONDUCTOR INC. 发明人 KO MIN GU
分类号 H01L23/52 主分类号 H01L23/52
代理机构 代理人
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