发明名称 Apparatus of testing substrate For LCD
摘要 PURPOSE: An apparatus for inspecting a substrate for LCD is provided to supply AC voltage to each signal line formed on a substrate by a non-contact method and to sense the signal line through a sensor unit. CONSTITUTION: A substrate transfer system transfers a substrate(2) in one direction. A feeding unit(210) supplies voltage to a signal line(12) on a transferred substrate by a non-contact method. A sensor unit(220) senses the signal line by using the non-contact method. A signal processing unit determines the short circuit and disconnection of the signal line through a voltage value measured through the sensor unit.
申请公布号 KR20120130980(A) 申请公布日期 2012.12.04
申请号 KR20110049116 申请日期 2011.05.24
申请人 发明人
分类号 G02F1/1345;G01R1/067;G02F1/13 主分类号 G02F1/1345
代理机构 代理人
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