发明名称 |
Positive resist composition and method of forming resist pattern |
摘要 |
A positive resist composition including a polymeric compound (A1) having a structural unit (a0) represented by general formula (a0-1) (R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, R2 represents a divalent linking group, R3 represents a cyclic group containing —SO2— within the ring skeleton thereof) and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group, an acid-generator component (B) and a fluorine-containing polymeric compound (F1) having a structural unit containing a base dissociable group. |
申请公布号 |
US8323869(B2) |
申请公布日期 |
2012.12.04 |
申请号 |
US20100721291 |
申请日期 |
2010.03.10 |
申请人 |
SHIMIZU HIROAKI;NITO HIDETO;TSUCHIYA JUNICHI;DAZAI TAKAHIRO;TOKYO OHKA KOGYO CO., LTD. |
发明人 |
SHIMIZU HIROAKI;NITO HIDETO;TSUCHIYA JUNICHI;DAZAI TAKAHIRO |
分类号 |
G03C1/00;G03F1/00;G03F7/00 |
主分类号 |
G03C1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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