发明名称 Positive resist composition and method of forming resist pattern
摘要 A positive resist composition including a polymeric compound (A1) having a structural unit (a0) represented by general formula (a0-1) (R represents a hydrogen atom, an alkyl group of 1 to 5 carbon atoms or a halogenated alkyl group of 1 to 5 carbon atoms, R2 represents a divalent linking group, R3 represents a cyclic group containing —SO2— within the ring skeleton thereof) and a structural unit (a1) derived from an acrylate ester containing an acid dissociable, dissolution inhibiting group, an acid-generator component (B) and a fluorine-containing polymeric compound (F1) having a structural unit containing a base dissociable group.
申请公布号 US8323869(B2) 申请公布日期 2012.12.04
申请号 US20100721291 申请日期 2010.03.10
申请人 SHIMIZU HIROAKI;NITO HIDETO;TSUCHIYA JUNICHI;DAZAI TAKAHIRO;TOKYO OHKA KOGYO CO., LTD. 发明人 SHIMIZU HIROAKI;NITO HIDETO;TSUCHIYA JUNICHI;DAZAI TAKAHIRO
分类号 G03C1/00;G03F1/00;G03F7/00 主分类号 G03C1/00
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