ELECTROMAGNETIC PERFORMANCE DETECTION METHOD FOR ORIENTED SILICON STEEL.

摘要

An electromagnetic performance detection method for oriented silicon steel involves measuring the Euler angles(α, β, γ) of every grain in a sample through a metallographic etch pit method, calculating the oriented deviation angle θi(degree)_{of the grain, and correcting the magnetic performance B0(T) of a single crystal material with the parameters of θi, Si, X, wherein Si(mm2) is the area of the grain, X is the correction coefficient of a silicon element, X=0.1-10(T/degree), and the correcting formula is (I). Through the above calculation, the electromagnetic performance B8 of oriented silicon steel is obtained. The detection method can complete the magnetic performance detection of the sample on condition that there is no magnetic measurement device or the magnetic measurement device fails to be used because of the underweight and undersize or the poor surface quality of the sample.}