发明名称 INTEGRATED CIRCUIT MEMORY DEVICE
摘要 A semiconductor memory device includes a plurality of memory regions formed on one chip, each of the memory regions having a plurality of volatile memory cells that are formed with a density or capacity of 2̂K bits, where K is an integer greater than or equal to 0, and a plurality of input/output (I/O) terminals for inputting and outputting data of the volatile memory cells, and at least one peripheral region that controls a write operation for writing data into the memory regions and a read operation for reading data from the memory regions based on a command and an address input from outside. Thus, a total or entire density of the memory regions corresponds to a non-standard (or interim) density so that the semiconductor memory device may have an interim density.
申请公布号 US2012300555(A1) 申请公布日期 2012.11.29
申请号 US201213478774 申请日期 2012.05.23
申请人 SHIN CHOONG-SUN;CHOI JOO-SUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN CHOONG-SUN;CHOI JOO-SUN
分类号 G11C7/10;G11C7/22 主分类号 G11C7/10
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