| 摘要 |
<P>PROBLEM TO BE SOLVED: To solve a problem that, when a plurality of depth measurement devices are operating near each other, a planar pattern cannot be recognized due to obstruction by a planar pattern light-emitted by a nearby depth measurement device, and consequently depth calculation cannot be executed. <P>SOLUTION: The planar pattern is intermittently light-emitted, and almost only a light-emission period is used as an exposure period. Thus the probability of exposure during a period of the light-emission of the nearby depth measurement device is decreased. Consequently, the probability of recognition failure of the planar pattern is decreased. Further, it is detected that the planar pattern cannot be recognized, and a light-emission timing is changed. <P>COPYRIGHT: (C)2013,JPO&INPIT |
