发明名称 PROXIMITY EXPOSURE APPARATUS, METHOD FOR ALIGNING PROXIMITY EXPOSURE APPARATUS, AND METHOD FOR MANUFACTURING DISPLAY PANEL SUBSTRATE
摘要 <P>PROBLEM TO BE SOLVED: To shorten a tact time by quickly moving alignment marks of a substrate and an image acquisition device to positions relatively suited to an image recognition for each shot and quickly positioning a mask and the substrate. <P>SOLUTION: In a first substrate, the position of a chuck after the alignment of the substrate and the position of each image acquisition device are stored for each shot as registered positions of the shot. In a second or later substrate, the chuck and each image acquisition device are moved for each shot to the registered positions of the shot by a stage and each moving mechanism so as to bring alignment marks of the mask and of the substrate into view of each image acquisition device. Based on the positions of the alignment marks of the mask and the positions of the alignment marks of the substrate detected by an image processing device, the chuck is moved by the stage so as to align the substrate. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012234021(A) 申请公布日期 2012.11.29
申请号 JP20110101919 申请日期 2011.04.28
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 MINEGISHI MANABU;TOIKAWA HIROSHI;EDAKI ICHIRO;WATANABE HIROSHI
分类号 G03F9/00 主分类号 G03F9/00
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