发明名称 TESTING METHOD USING GUIDED WAVE
摘要 A testing method using a guided wave generates a guided wave to propagate through a subject as a testing target in a longitudinal direction of the subject, detects a reflected wave of the guided wave and examines the subject on the basis of the reflected wave. The testing method includes the steps of (A) obtaining data for defect amount estimation beforehand indicating a relationship between a defect amount of the subject and a magnitude of a reflected wave, (B) generating a guided wave so as to propagate through the subject, and detecting a reflected wave of the guided wave, and (C) estimating a defect amount of the subject on the basis of the data for defect amount estimation obtained at (A) and the magnitude of the guided wave detected at (B).
申请公布号 EP2527826(A1) 申请公布日期 2012.11.28
申请号 EP20100843897 申请日期 2010.02.12
申请人 IHI INSPECTION AND INSTRUMENTATION CO., LTD. 发明人 DAIKOKU KOKI;YOSHIZAKI MASATO;SATO SHUICHI
分类号 G01N29/04;G01N29/30;G01N29/44 主分类号 G01N29/04
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