| 发明名称 |
Test apparatus for measuring a characteristic of a device under test |
| 摘要 |
A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes. |
| 申请公布号 |
US8319503(B2) |
申请公布日期 |
2012.11.27 |
| 申请号 |
US20090590955 |
申请日期 |
2009.11.16 |
| 申请人 |
NEGISHI KAZUKI;HANSEN MARK;CASCADE MICROTECH, INC. |
发明人 |
NEGISHI KAZUKI;HANSEN MARK |
| 分类号 |
G01R29/26;G01R31/20 |
主分类号 |
G01R29/26 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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