发明名称 Probe device having a structure for being prevented from deforming
摘要 A reinforcing member is formed at a top surface side of a probe card including a support plate for supporting a contactor and a circuit board. A plurality of long guide holes are formed in an outer peripheral portion of the reinforcing member. Fixing members fixed to a holding member and collars formed around outer circumferences of the fixing members are formed in the guide holes. A length in a longitudinal direction of each of the guide holes is greater than a diameter of each of the collars, and a central line in the longitudinal direction of each of the guide holes passes through a center of the reinforcing member. Due to the guide holes, horizontal expansion of the reinforcing member itself is allowed.
申请公布号 US8319511(B2) 申请公布日期 2012.11.27
申请号 US20080745306 申请日期 2008.11.05
申请人 YONEZAWA TOSHIHIRO;TAKASE SHINICHIRO;TOKYO ELECTRON LIMITED 发明人 YONEZAWA TOSHIHIRO;TAKASE SHINICHIRO
分类号 G01R31/00 主分类号 G01R31/00
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