发明名称 Barrier film for flexible copper substrate and sputtering target for forming barrier film
摘要 A barrier film for a flexible copper substrate comprising a Co—Cr alloy film containing 5 to 30 wt % of Cr and a balance of unavoidable impurities and Co is provided. The barrier film has a thickness of 3 to 150 nm and a film thickness uniformity of 10% or less at 1&sgr;. A sputtering target for forming a barrier film comprising a Co—Cr alloy containing 5 to 30 wt % of Cr and a balance of unavoidable impurities and Co is also provided. The relative magnetic permeability in the in-plane direction of the sputtered face of the target is 100 or less. The barrier film for a flexible copper substrate and the sputtering target for forming such barrier film have a film thickness that is thin enough to prevent film peeling and inhibiting the diffusion of copper to a resin film such as polyimide, is capable of obtaining a sufficient barrier effect even in a minute wiring pitch and has barrier characteristics that will not change even when the temperature rises due to heat treatment or the like.
申请公布号 US8318314(B2) 申请公布日期 2012.11.27
申请号 US20090640075 申请日期 2009.12.17
申请人 IRUMATA SHUICHI;YAMAKOSHI YASUHIRO;JX NIPPON MINING & METALS CORPORATION 发明人 IRUMATA SHUICHI;YAMAKOSHI YASUHIRO
分类号 B32B15/08;B32B5/10;B32B15/00;B32B15/01;B32B15/20;B32B27/00;B32B27/06 主分类号 B32B15/08
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