发明名称 METHOD FOR RECLAIMING SEMICONDUCTOR WAFER AND POLISHING COMPOSITION
摘要 Provided is a polishing composition used for polishing a semiconductor wafer surface having a step in order to planarize the wafer surface and thereby reclaiming the semiconductor wafer. The polishing composition contains at least a step eliminating agent, which is adsorbed to the surface of the semiconductor wafer and acts to prevent etching of bottom portion of the step on the wafer surface during polishing. The step eliminating agent is, for example, a water-soluble polymer or a surfactant, and more specifically, a polyvinyl alcohol, a polyvinyl pyrrolidone, a polyethylene glycol, a cellulose, a carboxylic acid surfactant, a sulfonic acid surfactant, a phosphate ester surfactant, or an oxyalkylene polymer.
申请公布号 US2012295443(A1) 申请公布日期 2012.11.22
申请号 US201113575174 申请日期 2011.01.21
申请人 MORINAGA HITOSHI;ASAI MAIKO;FUJIMI INCORPORATED 发明人 MORINAGA HITOSHI;ASAI MAIKO
分类号 H01L21/306;B24B37/04;C09K13/00 主分类号 H01L21/306
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