发明名称 POSITIVE RESIST COMPOSITION, AND RESIST FILM, RESIST-COATED MASK BLANK, RESIST PATTERN FORMING METHOD AND PHOTOMASK EACH USING THE COMPOSITION
摘要 A positive resist composition contains: (A) a polymer compound having a structure where a hydrogen atom of a phenolic hydroxyl group is replaced by an acid labile group represented by the following formula (I): wherein R represents a monovalent organic group; A represents a group having a polycyclic hydrocarbon ring structure or a group having a polycyclic heterocyclic structure; and * represents a bonding position to an oxygen atom of the phenolic hydroxyl group.
申请公布号 WO2012153869(A1) 申请公布日期 2012.11.15
申请号 WO2012JP62722 申请日期 2012.05.11
申请人 FUJIFILM CORPORATION;TSUCHIMURA, TOMOTAKA;INASAKI, TAKESHI 发明人 TSUCHIMURA, TOMOTAKA;INASAKI, TAKESHI
分类号 G03F7/039 主分类号 G03F7/039
代理机构 代理人
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