发明名称 BENDING TEST APPARATUS FOR FLEXIBLE DEVICE
摘要 Provided is a bending test apparatus for flexible substrate which may increase or maximize reliability. The bending test apparatus includes a table, a first electrode part fixing one side of a flexible substrate on the table, a guide rail disposed adjacent to the first electrode part, the guide rail extending from the one side of the flexible substrate to the other side, a slider moved along the guide rail, and a second electrode part connected to the slider, the second electrode part approaching or spacing the other side of the flexible substrate to/from the first electrode part.
申请公布号 US2012285257(A1) 申请公布日期 2012.11.15
申请号 US201213459600 申请日期 2012.04.30
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 KIM GI HEON
分类号 G01N3/20 主分类号 G01N3/20
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