发明名称 FORMATION OF THROUGH-SILICON VIA (TSV) IN SILICON SUBSTRATE
摘要 To form a through-silicon via (TSV) in a silicon substrate without using plating equipment or using sputtering equipment or small metal particles, and form an interlayer connection by stacking a plurality of such silicon substrates, a through hole of a silicon substrate is filled using molten solder itself. In detail, solid solder placed above the through hole of the silicon substrate is molten and the molten solder is guided to and filled in the internal space. A metal layer can be deposited on an internal surface of the through hole beforehand, and also an intermetallic compound (IMC) can be formed in a portion other than the metal layer.
申请公布号 US2012286428(A1) 申请公布日期 2012.11.15
申请号 US201213466160 申请日期 2012.05.08
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 SAKUMA KATSUYUKI
分类号 H01L23/48;H01L21/50;H01L21/768 主分类号 H01L23/48
代理机构 代理人
主权项
地址