发明名称 SENSOR FOR MICROSCOPY
摘要 <p>This invention pertains to a method for microscopically imaging a sample, with a digital scanner comprising a sensor including a 2D array of pixels and to a digital scanning microscope carrying out this method. It is notably provided a method for microscopically imaging a sample with a scanner comprising a sensor including a 2D array of pixels in an XY coordinate system, the axis Y being substantially perpendicular to the scan direction, wherein the scanner is arranged such that the sensor can image an oblique cross section of the sample, and wherein the method comprises the steps of: —� activating a first sub-array of the 2D array of pixels, the first sub-array extending mainly along the Y axis at a first X coordinate (X1), —� creating a first image by imaging a first area of the sample by means of the first sub-array of pixels. According to aspects of the invention, it is further proposed a scanner carryout this method and using the same 2D array sensor for imaging and auto-focusing purpose.</p>
申请公布号 EP2519855(A1) 申请公布日期 2012.11.07
申请号 EP20100813042 申请日期 2010.12.22
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V. 发明人 HULSKEN, BAS;STALLINGA, SJOERD
分类号 G02B21/36;G02B21/24 主分类号 G02B21/36
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