| 摘要 |
PURPOSE: A test handler for a memory card is provided to reduce time to perform a test process and a classification process for the memory card and to improve reliability for performance of the memory card. CONSTITUTION: A tray unit(2) comprises a supply tray and a plurality of receiving trays. The supply tray receives a memory card to be tested. The plurality of receiving trays classifies the tested memory card according to a test result and accepts it. A test module(5) comprises a plurality of test units for testing the memory card in a first test region and a second test region. A buffer unit(4) is installed between the tray unit and the test unit. The buffer unit comprises a first buffer tool and a second buffer tool. The first buffer tool moves in order to carry the memory card between the first test region and a tray region in which the tray unit is placed. The second buffer tool move in order to carry the memory card between the tray region and the second test region. A transfer picker(3) transfers the memory card between the buffer unit and the tray unit. |
