发明名称 Continuous Mass Production Method of Semiconductor Nanowires with Controlled Lengths
摘要 PURPOSE: A consecutive mass production method of semiconductor nano-wires in which the length is controlled is provided to manufacture high purity nano-wires which do not include catalyst materials. CONSTITUTION: A consecutive mass production method of semiconductor nano-wires comprises the following steps: forming a net shaped metal film(200) in which a plurality of penetrating cavities is formed at the upper part of a semiconductor substrate(100); manufacturing a plurality of semiconductor substrate nano-wires(300) in which one end is adhered to the semiconductor substrate by wet etching the semiconductor substrate using the metal film as a catalyst; and applying ultrasound on the semiconductor substrate in which the semiconductor nano-wire is formed and cutting the semiconductor nano-wire from the semiconductor substrate in order to obtain the semi-conductor substrate and independent semiconductor nano-wires(400). After the third step, the partial etching step and the cutting step are repeatedly performed by using the semiconductor substrate.
申请公布号 KR20120121466(A) 申请公布日期 2012.11.06
申请号 KR20110039300 申请日期 2011.04.27
申请人 发明人
分类号 B82B3/00;B82B1/00;B82Y40/00 主分类号 B82B3/00
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