发明名称 METHOD FOR MANUFACTURING REFLECTIVE MASK, ION BEAM DEVICE FOR REFLECTIVE MASK, AND REFLECTIVE MASK
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a reflective mask, which can simply form a light shielding region and can achieve highly accurate pattern transfer, without increasing a manufacturing process such as resist coating, drawing, developing and etching, and without needing to prepare a special mask blank; an ion beam device for the reflective mask; and the reflective mask. <P>SOLUTION: The method for manufacturing the reflective mask includes: a preparation step of preparing a reflective mask which has a substrate, a multilayer film formed on the substrate and an absorption layer formed into a pattern shape on the multilayer film; and a light shielding region forming step of irradiating the outer periphery of a circuit pattern region in which the pattern of the absorption layer is formed with an ion beam of hydrogen or helium, forming a low reflection part by disturbing the regularity of a periodic structure of the multilayer film, and forming the light shielding region in which the low reflection part and the absorption layer are laminated on the substrate. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012212787(A) 申请公布日期 2012.11.01
申请号 JP20110077755 申请日期 2011.03.31
申请人 DAINIPPON PRINTING CO LTD 发明人 AMANO TAKESHI
分类号 H01L21/027;G03F1/22 主分类号 H01L21/027
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