| 摘要 |
<P>PROBLEM TO BE SOLVED: To reduce a vertical smear in a solid-state imaging apparatus using a CCD solid-state imaging element so that the device is not affected by a dark current of the CCD solid-state imaging element such as a white blemish. <P>SOLUTION: Dark current unevenness in a picture vertical direction of a signal obtained from a vertical shading pixel of four lines, which is read prior to an effective pixel of a light receiving face of the solid-state imaging element, is corrected, and a second minimum value of each vertical pixel signal in four lines of a vertical shading image is calculated and it is stored as a vertical smear correction signal. The signal is subtracted from an image signal after AGC, whose gain is varied by adjusting it to image AGC and which is outputted from the effective pixel of the light receiving face of the solid-state imaging element. The signal outputted from the solid-state imaging element is A/D-converted into 14 bits, a representative signal is calculated and the signal is attenuated to 15/16. Then, the signal is subtracted from the image signal outputted from the effective pixel of the light receiving face of the solid-state imaging element. <P>COPYRIGHT: (C)2013,JPO&INPIT |
