发明名称 DUAL WORK FUNCTION GATE STRUCTURES
摘要 A semiconductor chip having a transistor is described. The transistor having a gate electrode disposed over a gate dielectric. The gate electrode comprised of first gate material disposed on the gate dielectric and second gate material disposed on the gate dielectric. The first gate material being different than the second gate material. The second gate material also located at a source region or drain region of said gate electrode.
申请公布号 EP2517244(A2) 申请公布日期 2012.10.31
申请号 EP20100843438 申请日期 2010.12.02
申请人 INTEL CORPORATION 发明人 HAFEZ, WALID M.;RAHMAN, ANISUR
分类号 H01L27/092;H01L29/06;H01L29/40;H01L29/49;H01L29/66;H01L29/78;H01L29/82 主分类号 H01L27/092
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