发明名称 SPECIMEN ANALYZER
摘要 <P>PROBLEM TO BE SOLVED: To provide a specimen analyzer capable of providing information regarding a factor of uncertainty which affects analysis of a specimen. <P>SOLUTION: A specimen analyzer 1 includes: a measuring device 2; and an information processor 3. The information processor 3 includes: an analysis result database; an event history database; and an uncertainty factor database. The information processor performs list display of analysis results which are stored in the analysis result database, and accepts specification of any of the displayed analysis results. When the analysis result is specified, event information relevant to the analysis result and corresponding to an uncertainty factor is extracted from the event history database, and displayed. When any of pieces of the displayed event information is selected, a countermeasure for reducing uncertainty relevant to the selected event information is displayed. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012208099(A) 申请公布日期 2012.10.25
申请号 JP20110076083 申请日期 2011.03.30
申请人 SYSMEX CORP 发明人 INOMATA NORIKAZU;KANO DAIKI
分类号 G01N35/00 主分类号 G01N35/00
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