发明名称 GEM POSITIONING AND ANALYSIS SYSTEM
摘要 A gemstone positioning and analysis system is disclosed for measuring various characteristics of a gemstone. The system includes a narrow band spectrophotometer that allows the authenticity of the gemstone to be determined along with other characteristics of the gemstone. A clear mounting plate is also included that has a series of markings to facilitate centering the gemstone within an analysis chamber. An alignment device is included that has at least one linear pusher and is adapted to automatically center the gemstone at the centermost point of the clear mounting plate.
申请公布号 US2012268728(A1) 申请公布日期 2012.10.25
申请号 US201113277912 申请日期 2011.10.20
申请人 WAGNER RANDALL;SCHOECKERT KURT P.;GEMEX SYSTEMS, INC., A WISCONSIN CORPORATION 发明人 WAGNER RANDALL;SCHOECKERT KURT P.
分类号 G01N21/01 主分类号 G01N21/01
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