| 摘要 |
The object of the present invention is to suppress a high impedance state of scan lines in a case where the scan lines are driven by using a demultiplexer. A logic AND circuit 34 outputs signals resulting from logical product of block selection signals Y-1, Y-2, and Y-3, . . . , and Y-80 and a signal Enb as address signals Ad-1, Ad-2, and Ad-3, . . . , and Ad-80. A demultiplexer 40 distributes address signals Ad-1, Ad-2, Ad-3, . . . , and Ad-80 to scan lines 112 in accordance with selection signals Sel-1, Sel-2, and Sel-3. Drains of TFTs 140 are connected to the scan lines 112. The TFTs 140 are controlled to be turned on/off, for example, by using a signal Sel-all that is a logically inverted signal of the signal Enb, and when the TFTs are turned on, level L is determined. |
