| 摘要 |
The invention relates to a method for imaging a sample using a microscope, in particular a scanning microscope, in which the sample is illuminated with excitation light via an illuminating beam path, and light emitted from the sample is recorded via a detection beam path, wherein at least one adjustable beam splitter having an adjustable threshold wavelength is arranged in the detection beam path or/and in the illuminating beam path, and wherein light emitted from the sample is detected in at least one detection channel. According to the inventive method, for at least one predetermined sample region, a signal intensity of light detected in the at least one detection channel is recorded for a plurality of threshold wavelengths set at the adjustable beam splitter to obtain a signal/threshold-dependency of the predetermined sample region. |
