发明名称 Nonvolatile semiconductor memory device with reduced size of peripheral circuit area
摘要 A peripheral circuit area is formed around a memory cell array area. The peripheral circuit area has element regions, an element isolation region isolating the element regions, and field-effect transistor formed in each of the element regions and including a gate electrode extending in a channel width direction, on a semiconductor substrate. An end portion and a corner portion of the gate electrode are on the element isolation region. A radius of curvature of the corner portion of the gate electrode is smaller than a length from the end portion of the element region in the channel width direction to the end portion of the gate electrode in the channel width direction, and is less than 85 nm.
申请公布号 US8294238(B2) 申请公布日期 2012.10.23
申请号 US20100765477 申请日期 2010.04.22
申请人 KUTSUKAKE HIROYUKI;TOBA TAKAYUKI;KATO YOSHIKO;GOMIKAWA KENJI;KOYAMA HARUHIKO;KABUSHIKI KAISHA TOSHIBA 发明人 KUTSUKAKE HIROYUKI;TOBA TAKAYUKI;KATO YOSHIKO;GOMIKAWA KENJI;KOYAMA HARUHIKO
分类号 H01L21/70 主分类号 H01L21/70
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