发明名称
摘要 <p>A detection circuit arrangement in a plasma processing chamber having movable lower electrode is provided. The arrangement includes flexible connector having a first flexible connector end, a second flexible connector end and at least a slit. At least portion of the slit is disposed in a direction parallel to a line drawn between two flexible connector ends. One end is coupled to the movable lower electrode and another end is coupled to a component of the plasma processing chamber. Flexible connector provides low impedance current path between the movable lower electrode and the component of the plasma processing chamber. The arrangement also includes means for detecting current flow through conductor material disposed on one side of the slit. The means for detecting includes at least a coil wound around the conductor material and a detector circuit coupled to the coil for detecting the current flow interruption due to a tear.</p>
申请公布号 JP2012525683(A) 申请公布日期 2012.10.22
申请号 JP20120508566 申请日期 2010.04.26
申请人 发明人
分类号 H05H1/46;G01R31/04;H01L21/3065 主分类号 H05H1/46
代理机构 代理人
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