| 发明名称 |
METHOD FOR COMPARATIVE ASSESSMENT OF RELIABILITY OF SEMICONDUCTOR PRODUCTS IN PLASTIC ENCLOSURES |
| 摘要 |
FIELD: electricity. ^ SUBSTANCE: at identical samples from compared batches of semiconductor products in plastic enclosures, electric parameters are measured, then they are boiled in distilled water for 2-3 hours, and electric parameters are again measured after 2 hours of their soaking under normal conditions. Batches are compared on the basis of test results. ^ EFFECT: increased efficiency of comparative tests performance for moisture resistance of semiconductor products in plastic enclosures. |
| 申请公布号 |
RU2464583(C2) |
申请公布日期 |
2012.10.20 |
| 申请号 |
RU20090142351 |
申请日期 |
2009.11.17 |
| 申请人 |
GOSUDARSTVENNOE OBRAZOVATEL'NOE UCHREZHDENIE VYSSHEGO PROFESSIONAL'NOGO OBRAZOVANIJA "VORONEZHSKIJ GOSUDARSTVENNYJ TEKHNICHESKIJ UNIVERSITET" |
发明人 |
GORLOV MITROFAN IVANOVICH;TIKHONOV ROMAN MIKHAJLOVICH;MESHKOVA MARIJA ALEKSANDROVNA |
| 分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
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