发明名称 RADIATION SOURCE, LITHOGRAPHIC DEVICE, AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a radiation source having a contamination barrier for reducing a deposition rate of ions, atoms, molecules, granular debris and the like on a collector mirror of an EUV radiation source. <P>SOLUTION: A radiation source includes a plasma formation portion, at which fuel comes into contact with a radiation beam to form a plasma. A collector with a mirror collects and reflects EUV radiation generated at a first focal point toward a second focal point. A contamination barrier is positioned so that a peripheral edge of the contamination barrier does not block more than 50% of a solid angle defined by a mirror at the second focal point, and thereby, the EUV radiation reflected by the collector mirror passes through the contamination barrier and is not attenuated excessively. The contamination barrier functions to trap fuel materials such as ions, atoms, molecules or nano droplets from the plasma, so as to prevent them from being accumulated on the collector mirror. A gas extraction port may be provided near the plasma formation portion to restrain diffusion of the fuel debris and contamination toward the collector mirror. <P>COPYRIGHT: (C)2013,JPO&INPIT
申请公布号 JP2012199582(A) 申请公布日期 2012.10.18
申请号 JP20120129640 申请日期 2012.06.07
申请人 ASML NETHERLANDS BV 发明人 SCHIMMEL HENDRIKUS GIJSBERTUS;BANINE VADIM YEVGENYEVICH;LOOPSTRA ERIK ROELOF
分类号 H01L21/027;H05G2/00 主分类号 H01L21/027
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