| 发明名称 |
Simulation test system and method for testing vehicle electronic component |
| 摘要 |
Disclosed is a simulation test system and method for testing a vehicle electronic component capable of easily testing performance of the electronic component anytime regardless of location without repeating the same driving test. |
| 申请公布号 |
US8290661(B2) |
申请公布日期 |
2012.10.16 |
| 申请号 |
US20080274835 |
申请日期 |
2008.11.20 |
| 申请人 |
HAN JIN GON;KIM JOON SANG;CHOI MYUNG SUNG;JANG SUNG HWAN;HYUNDAI MOTOR COMPANY |
发明人 |
HAN JIN GON;KIM JOON SANG;CHOI MYUNG SUNG;JANG SUNG HWAN |
| 分类号 |
G01M17/00;G06F19/00 |
主分类号 |
G01M17/00 |
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