发明名称 |
MEASUREMENT OBJECT SURFACE ABNORMALITY IDENTIFICATION DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a measurement object surface abnormality identification device capable of accurately identifying a surface abnormality such as oxidized scale generated on a high-temperature measurement object. <P>SOLUTION: The present invention uses a measurement object surface abnormality identification device 1 which comprises: an image synthesis section 10 which creates a synthesized radiant light image by synthesizing a plurality of radiant light images obtained through imaging radiant light from a high-temperature measurement object 5 by a radiant light imaging section 18 every time the measurement body rotates a prescribed angle; a first luminance correction section 12 which extracts a prescribed region from the synthesized radiant light image and corrects a luminance change in an image of the prescribed region due to a reduction in temperature of the measurement object 5 during the same is imaged; and an abnormality determination section 14 which detects a prescribed dark section in the prescribed region of the corrected image and determines that the dark section in the prescribed region of the image is a surface abnormality of the measurement object. <P>COPYRIGHT: (C)2013,JPO&INPIT |
申请公布号 |
JP2012194108(A) |
申请公布日期 |
2012.10.11 |
申请号 |
JP20110059393 |
申请日期 |
2011.03.17 |
申请人 |
TOYOTA CENTRAL R&D LABS INC;AICHI STEEL WORKS LTD |
发明人 |
ISHII YASUHIRO;WATANABE KEIICHI;KITAYAMA KOJI;FUTAHO YOSHINORI;FUJISAWA KAZUYA |
分类号 |
G01B11/30;G01B11/24;G01J5/48;G01N21/892 |
主分类号 |
G01B11/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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