Projective optical metrology system for determining attitude and position

摘要

Described herein is a projective optical metrology system (1) including: a light target (2) equipped with a plurality of light sources (4a-4c) having a pre-set spatial arrangement; an optoelectronic image sensor (10); an optical unit (6) receiving a light signal (R 1 , R 2 ) coming from the light target and defining two different optical paths for the light signal towards the optoelectronic image sensor, the two optical paths being such as to cause simultaneous formation on the optoelectronic image sensor of at least two images (I 1 , I 2 ) of the light target; and an electronic processing unit (30) coupled to the optoelectronic image sensor and determining a plurality of different quantities indicating the position and attitude of the light target with respect to the optical unit, on the basis of the two images.